Electron Probe Microanalysis

**Definition:** Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.

**Tree numbers:** - E01.370.350.515.402.250 - E05.196.867.800.360 - E05.595.402.250 - E05.799.830.360

**Synonyms:** - Spectrometry, X Ray Emission, Electron Microscopic - Microanalysis, Electron Probe - Spectrometry, X Ray Emission, Electron Probe - Spectrometry, X-Ray Emission, Electron Microscopic - Spectrometry, X-Ray Emission, Electron Probe - X Ray Emission Spectrometry, Electron Microscopic - X Ray Emission Spectrometry, Electron Probe - X-Ray Emission Spectrometry, Electron Microscopic - X-Ray Emission Spectrometry, Electron Probe - X-Ray Microanalysis - X-Ray Microanalysis, Electron Microscopic - Microscopy, Electron, X-Ray Microanalysis - X-Ray Microanalysis, Electron Probe