Microscopy, Atomic Force

**Definition:** A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.

**Tree numbers:** - E01.370.350.515.666.400 - E05.595.666.400

**Synonyms:** - Atomic Force Microscopy - Scanning Force Microscopy - Force Microscopy