SCANNING-PROBE TECHNIQUES OR APPARATUS

**Definition:** This place covers:

Scanning probes, i.e. devices having at least a tip of nanometre sized dimensions that scans or moves over an object surface, typically at a distance of a few angstroms or nanometres, monitoring some interaction between the tip and the surface, e.g. monitoring the generation of a tunnelling current.

Techniques or apparatus involving the use of scanning probes.

The following subjects are therefore covered, the list being non-exhaustive:

**Limiting references (this place does not cover):** - Electron or ion microscopes (e.g. scanning electron microscopes, transmission electron microscopes) and details thereof -> H01J37/00